Correlation between structural and morphological properties of multilayer perovskite ZnTiO3 coated porous silicon
Groupe de Recherche des Semi-conducteurs, des Nanostructures et des Technologies Avancées (SNTA), Laboratoire de Photovoltaïque (LPV), Centre de Recherches et des Technologies de l'Energie (CRTEn) Borj Cedria B.P N°95 2050, Hammam Lif, Tunisia
2 Faculty of Mathematical, Physical and Natural Sciences of Tunis, University of Tunis, El Manar, Tunisia
3 Institute of Catalysis and Petrochemical, CSIC, Marie Curie, 2, Cantoblanco, Madrid 28049, Spain
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Received in final form: 31 March 2021
Accepted: 28 April 2021
Published online: 21 June 2021
This work reports on correlation between structural and morphological properties of ZnTiO3/porous silicon (PS). The PS was elaborated by electrochemical anodization from the single- crystal p-type silicon wafer. Nanocrystalline ZnTiO3 thinfilms have been prepared on PS using sol-gels pin coating technique. The deposited films were annealed in air at 800 °C for 2 h. The structural and morphological properties of the films were studied for different number of layers. X-ray diffraction spectra confirms that ZnTiO3 films were hexagonal phase and the crystallite size of ZnTiO3 films increased from 111 to 125 nm when the number of layers increase from 4 to 8 layers. SEM image shows approximate semi-spherical particles with a little agglomeration for all samples. The morphologies changed and the average grain size changed and increases from 81 nm to 131 nm.
Note to the reader: Further to the publication of an erratum, the citation of the article was modified on 19 July 2021.
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