Original Article
Spectroscopic ellipsometric evaluation of multilayer thin-film roughness using a genetic algorithm
Published online: 24 April 2026
DOI: 10.1051/epjap/2026003
The European Physical Journal - Applied Physics
Special Issue on ‘Imaging, Diffraction, and Spectroscopy on the micro/nanoscale (EMC 2024)’, edited by Jakob Birkedal Wagner and Randi Holmestad
Open Access
Original Article
Solvent-induced softening of polymethyl methacrylate surfaces studied using atomic force microscopy
Published online: 17 October 2025
DOI: 10.1051/epjap/2025026
Open Access
Original Article
In-situ liquid phase TEM of trapped nanoparticles: native-state observation and structural characterization
Published online: 21 August 2025
DOI: 10.1051/epjap/2025019
Open Access
Original Article
Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials
Published online: 30 July 2025
DOI: 10.1051/epjap/2025018
Open Access
Original Article
Advances in atomic resolution secondary electron imaging
Published online: 20 March 2025
DOI: 10.1051/epjap/2025007
Open Access
Original Article
Unraveling protein repulsion forces with nanocelluloses: insights from force spectroscopy
Published online: 17 March 2025
DOI: 10.1051/epjap/2025005
Open Access
Original Article
Edge-Detected 4DSTEM - effective low-dose diffraction data acquisition method for nanopowder samples in an SEM instrument
Published online: 18 February 2025
DOI: 10.1051/epjap/2025002
