The European Physical Journal Applied Physics (EPJ AP)

Original Article

Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials

Hoelen L. Lalandec Robert, Max Leo Leidl, Knut Müller-Caspary and Jo Verbeeck

Received: 06 December 2024 / Revised: 19 May 2025 / Accepted: 23 May 2025

DOI: 10.1051/epjap/2025018

PDF (30.97 MB)

Open Access

Original Article

Advances in atomic resolution secondary electron imaging

Joel Martis, Benjamin Plotkin-Swing, Michael T. Hotz, Niklas Dellby, Tracy C. Lovejoy, Steven C. Quillin, Tomáš Radlička, Cong Su, Gerardo Algara-Siller and Ondrej L. Krivanek

Published online: 20 March 2025

DOI: 10.1051/epjap/2025007

Open Access

Original Article

Unraveling protein repulsion forces with nanocelluloses: insights from force spectroscopy

Jing Li

Published online: 17 March 2025

DOI: 10.1051/epjap/2025005

Open Access

Original Article

Edge-Detected 4DSTEM - effective low-dose diffraction data acquisition method for nanopowder samples in an SEM instrument

Nikita Denisov, Andrey Orekhov and Johan Verbeeck

Published online: 18 February 2025

DOI: 10.1051/epjap/2025002

EPJ

The European Physical Journal - Applied Physics

Special Issue on ‘Imaging, Diffraction, and Spectroscopy on the micro/nanoscale (EMC 2024)’, edited by Jakob Birkedal Wagner and Randi Holmestad

Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials

Advances in atomic resolution secondary electron imaging

Unraveling protein repulsion forces with nanocelluloses: insights from force spectroscopy

Edge-Detected 4DSTEM - effective low-dose diffraction data acquisition method for nanopowder samples in an SEM instrument

Conference announcements