2021 Impact factor 1.168
Applied Physics

The European Physical Journal Applied Physics (EPJ AP): All issues

2016 Vol. 73-76
24701-24718 Special issue
6th Central European Symposium on Plasma Chemistry (CESPC-6)
24601-24616 Special issue
Materials for Energy Harvesting, Conversion and Storage (ICOME 2015)
2013 Vol. 61-64
14401-11301
International Semiconductor Conference Dresden-Grenoble – ISCDG 2012
24301-24326
Topical issue: 13th International Symposium on High Pressure Low Temperature Plasma Chemistry (Hakone XIII). Edited by Nicolas Gherardi, Henryca Danuta Stryczewska and Yvan Ségui
2011 Vol. 53-56
34101-31302
Focus on organic electronic devices
24001-24027 Special issue
Topical Issue: 18th International Colloquium on Plasma Processes (CIP 2011)
13701-11404
Topical Issue: 5th Colloquium Interdisciplinary in Instrumentation (C2I) 2010
23901-21102
International Symposium on Flexible Organic Electronics 2010 (ISFOE)
13801-11302
Focus on Hakone XII
33501-30001
Focus on Recent advances in (S)TEM and related spectroscopies: a tribute to C. Colliex
23401-21301
Focus on Fuel Cells 2009
30101-33609
Focus on Telecom 2009 & JFMMA
2010 Vol. 49-52
23301-21101
Focus on Numelec
33201-30901
Focus on Flexible Organic Electronics
12901-11401
Focus on Electrical Contacts
33001-31601
Focus on Metamaterials
22901-21001
International Conference on Electrical Contacts (ICEC 2008)
13101-11101
17th International Colloquium on Plasma Processes (CIP 2009)
2009 Vol. 45-48
22801-22821 Special issue
11th International Symposium on High Pressure, Low Temperature Plasma Chemistry (HAKONE XI)
12701-11202
4th Colloquium Interdisciplinary in Instrumentation (C2I 2007)
32601-31001
Metamaterials
12501-12513 Special issue
International Symposium on Flexible Organic Electronics (IS-FOE)
2008 Vol. 41-44
pp. 1-107
10th Meeting of the French Microscopy Society (SFMU)
pp. 269-368 Special issue
Topical Issue ITFPC (Innovations on Thin Films Processing and Characterisation)
pp. 159-268
Reliability in Electromagnetic Systems (IET)
pp. 1-66 Special issue
16th International Colloquium on Plasma Processes (CIP 2007)
2004 Vol. 25-28
pp. 7-506 Special issue
Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
pp. 177-176
14th International Colloquium on Plasma Processes (CIP 2003)
Editors-in-Chief
S. Giorgio and D. Jacob
ISSN (Print Edition): 1286-0042
ISSN (Electronic Edition): 1286-0050

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