Free Access
Editorial
10th Meeting of the French Microscopy Society - Grenoble 2007
Published online: 21 August 2008
DOI: 10.1051/epjap:2008149
The European Physical Journal - Applied Physics
10th Meeting of the French Microscopy Society (SFMU)
Gold and silver nanoparticles embedded in dielectric-capping layers studied by HAADF-STEM
Published online: 23 April 2008
DOI: 10.1051/epjap:2008051
A combined FEG-SEM and TEM study of silicon nanodot assembly
Published online: 30 April 2008
DOI: 10.1051/epjap:2008063
Confocal microscopy of geometrically frustrated hard sphere crystals
Published online: 22 July 2008
DOI: 10.1051/epjap:2008145
Tomographic diffractive microscopy of transparent samples
Published online: 16 April 2008
DOI: 10.1051/epjap:2008049
Combined analysis with WDS/EDS spectrometers in SEM
Published online: 17 July 2008
DOI: 10.1051/epjap:2008146
