Eur. Phys. J. AP 23, 111-115 (2003)
https://doi.org/10.1051/epjap:2003045

Preparation and characterization of Co₃O₄ films prepared via Pechini method^*

Key Laboratory of Automobile Materials, Ministry of Education, China and College of Materials Science and Engineering, Jilin University, Changchun 130023, PR China

Corresponding author: mat@mail.jlu.edu.cn

Received: 30 April 2002
Revised: 23 January 2003
Accepted: 4 March 2003
Published online: 12 June 2003

Abstract

Co₃O₄ thin films were prepared via the Pechini method using spin-coating and sintering processes. X-ray diffraction (XRD), atomic force microscopy (AFM), and Raman spectroscopy were employed to characterize the films. The XRD pattern from the prepared films can be indexed based on a spinel structure. Ordered crystalline columns and high quality surfaces are observed via the AFM images. It is found out that the grain size increases with the sintering temperature. Minimum roughness of the film can be obtained at PEG content 60 mg/ml. Raman spectroscopy confirms that the films are crystallized in the spinel structure. A red shift observed in all bands shows that the cohesive energy is lower in the film than in the bulk crystal.