https://doi.org/10.1051/epjap:2004002
Study of the structure of PZT films: influence of the thermal treatments. Advanced ferroelectric characterisation
1
PPSM (CNRS UMR 8531), ENS Cachan, 61 avenue du Président Wilson, 94235 Cachan Cedex 4, France
2
SATIE (CNRS UMR 8029), ENS Cachan, 61 avenue du Président Wilson, 94235 Cachan Cedex 4, France
3
LPCML (CNRS UMR 5620), Université Lyon I, 10 rue A.M. Ampère, 69622 Villeurbanne
Cedex, France
Corresponding author: cima@satie.ens-cachan.fr
Received:
26
September
2002
Revised:
23
September
2003
Accepted:
14
October
2003
Published online:
19
January
2004
Thin films of PbZr
TixO3 have been elaborated using the
sol-gel process. We have characterised the thermal behaviour of the sol and
of the film of PZT. The different orientations were observed according to
the temperature of pyrolysis: [111] at 500 °C, [100] at 450 °C.
Finally, an advanced method of electrical characterisation of ferroelectrics
is used by separating the reversible and irreversible contributions of
polarisation. An experimental Preisach density is then measured and modeled
and allows to extract ferroelectric properties. These parameters are
independent from electric field strength applied through the sample, leading
to a powerful tool to characterise the electrical behaviour.
PACS: 81.20.Fw – Sol-gel processing, precipitation / 68.55.-a – Thin film structure and morphology / 77.80.Dj – Domain structure; hysteresis
© EDP Sciences, 2004
