Eur. Phys. J. Appl. Phys. 41, 97-101 (2008)
https://doi.org/10.1051/epjap:2008009

Morphological, electrical and optical properties of 1-(3-hydroxypropylamino)-9,10-anthraquinone films prepared by Hot Wall technique^*

¹ Material Science Laboratory, Department of Physics, Guru Nanak Dev University, Amritsar 143005, India
² Department of Physics, Kanya Maha Vidyalaya, Jalandhar 144 004, India
³ Department of Chemistry, Guru Nanak Dev University, Amritsar 143005, India

Corresponding author: rkbedi@rediffmail.com

Received: 16 February 2007
Revised: 9 October 2007
Accepted: 15 November 2007
Published online: 6 February 2008

Abstract

The films of 1-(3-hydroxypropylamino)-9,10-anthraquinone (1) obtained by Hot Wall Epitaxy technique (HWE) have been studied for their morphological and electrical properties. The films were deposited on to the glass substrate at different temperatures kept at pressure of ~1.33 × 10⁻³ Pa. The powder X-ray diffraction (XRD) spectra show the polycrystalline nature of the films. The crystallanity of the films increases with the increase in film deposition temperature. Scanning electron microscope (SEM) shows that the molecules of 1 undergo uniform aggregation to form blade type crystallites with width 5.2–11.8 μm and length 32.6–90 μm at substrate temperature 348 K. The conduction in these films is ohmic in nature and both the increase in substrate temperature during film deposition and increase in absolute temperature of the films during conductivity measurement resulted in increased conductivity. The band gap lies in the range 1.25–1.44 eV