https://doi.org/10.1051/epjap:2008133
Analog set-up for non linear dielectric measurements up to 100 kHz
1
Institut Universitaire de Technologie, 19 rue L. David, BP 689, 62228 Calais Cedex, France
2
LEMCEL, 50 rue F. Buisson, BP 717, 62228 Calais Cedex, France
3
Military University of Technology, Kaliskiego 2, 00-908 Warszawa, Poland
Received:
5
September
2007
Accepted:
30
May
2008
Published online:
17
July
2008
In this paper, we present a new analog set-up for non linear dielectric measurements. The device is based on the auto-balanced bridge principle used in impedance analyzers. Its main advantage is to operate at high frequencies in comparison with a classical current amplifier. This extension consists in extracting the harmonics of a non sinusoidal current crossing the material. The set-up is used to perform non linear dielectric measurements on a ferroelectric liquid crystal and shows better performances than a previously published digital set-up.
PACS: 84.30.-r – Electronic circuits / 84.37.+q – Measurements in electric variables / 07.50.-e – Electrical and electronic instruments and components
© EDP Sciences, 2008
