Spectroscopic investigations on tetravalent doped LiCoO2 thin film cathodes

M. C. Rao; O. M. Hussain

doi:10.1051/epjap/2009142

EPJ

a
b
c
d
e
ap
st
h
plus
ds
pv
ti
qt
am
n

2024 Impact factor 0.9

Applied Physics

Eur. Phys. J. Appl. Phys. 48, 20503 (2009)
https://doi.org/10.1051/epjap/2009142

Spectroscopic investigations on tetravalent doped LiCoO₂ thin film cathodes

M. C. Rao¹ and O. M. Hussain²

¹ Department of Physics, Andhra Loyola College, Vijayawada 520 008, India
² Thin Film Laboratory, Department of Physics, Sri Venkateswara University, Tirupati 517 502, India

Corresponding author: raomc72@gmail.com

Received: 4 January 2009
Accepted: 8 June 2009
Published online: 17 September 2009

Abstract

Titanium-doped LiCoO₂ thin films were grown by pulsed laser deposition technique on silicon substrates. Structure, AFM, FTIR, Raman and Optical properties were studied with respect to their deposition parameters i.e. substrate temperature $(T_{s})$ and oxygen partial pressure $(p_{{\rm O}_{2}})$ in the deposition chamber. The films deposited in $p_{{\rm O}_{2}}= 100$ m Torr showed good crystallinity on silicon substrates maintained at $T_{s}= 700$ °C. It was found that such a film crystallizes in the layered α-NaFeO₂ structure. The influence of titanium doping on particle size and morphologies has been clearly studied. FTIR spectra displayed the characteristic IR dominant bands at 246 and 550 cm⁻¹ for titanium doped LiCoO₂ thin films. The Raman peaks observed for the films at 594 cm⁻¹ and 485 cm⁻¹ are ascribed to Raman active modes A_1g and E_g respectively. The influence of titanium doping on the physical properties has been systematically studied.