Eur. Phys. J. Appl. Phys. 51, 21202 (2010)
https://doi.org/10.1051/epjap/2010093

Sub-wavelength surface IR imaging of soft-condensed matter

¹ School of Chemical Science and Pharmacy, University of East Anglia, Norwich, NR4 7TJ, UK
² Ginzton Laboratory, Stanford University, Stanford, 94305-4088 CA, USA

Corresponding author: james.rice@ucd.ie

Received: 19 April 2010
Revised: 27 May 2010
Accepted: 3 June 2010
Published online: 7 July 2010

Abstract

Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.