https://doi.org/10.1051/epjap/2011100414
Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM
Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba
305-8565, Japan
a e-mail: suenaga-kazu@aist.go.jp
Received:
20
October
2010
Accepted:
8
March
2011
Published online:
9
June
2011
Imaging and chemical analysis of individual metallofullerene molecules were successfully carried out without massive destruction using a scanning transmission electron microscope (STEM) operated at 30 kV. Electron energy-loss spectroscopy (EELS) unambiguously identified the constituent atom of each metallofullerene molecule. The profile of EELS chemical map measured across the single atom provides a rough estimate of EELS signal delocalization, which is considerably reduced using accelerating voltage as low as 30 kV.
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