Eur. Phys. J. Appl. Phys. (2014) 66: 10701
https://doi.org/10.1051/epjap/2014130556

Virtual dark-field images reconstructed from electron diffraction patterns

Science et Ingénierie des Matériaux et des Procédés – (CNRS UMR 5266) INPG-UJF, BP 46, 38402 Saint Martin d’Hères Cedex, France

^a e-mail: edgar.rauch@simap.grenoble-inp.fr

Received: 6 December 2013
Revised: 14 March 2014
Accepted: 18 March 2014
Published online: 21 April 2014

Abstract

Bright- and dark-field images are reconstructed by extracting the intensities of selected spots from a succession of digitalized electron diffraction patterns collected using a transmission electron microscope by scanning the focused beam over the area of interest. The procedure is similar to the generation of the scanning-transmission electron microscopy images. Several examples are shown to illustrate the flexibility and potentiality of such numerical off-line reconstruction.