https://doi.org/10.1051/epjap/2014140253
Fast Track Article
Comparative study of UV radiation hardness of n+p and p+n duo-lateral position sensitive detectors
1
Department of Information Technology and Media, Mid Sweden University, Holmsgatan 10, SE-85170
Sundsvall, Sweden
2
SiTek Electro Optics, Ögärdesvägen 13A, SE-43330
Partille, Sweden
a e-mail: xerviar@yahoo.com
Received:
20
June
2014
Revised:
31
July
2014
Accepted:
12
August
2014
Published online:
15
October
2014
We report experimental results on the degree of radiation damage in two duo-lateral position sensitive detectors (LPSDs) exposed to 193 nm and 253 nm ultraviolet (UV) beam. One of the detectors was an in-house fabricated n+p LPSD and the other was a commercially available p+n LPSD. We report that at both wavelengths, the degradation damage from the UV photons absorption caused a much more significant deterioration in responsivity in the p+n LPSD than in the n+p LPSD. By employing a simple method, we were able to visualize the radiation damage on the active area of the LPSDs using 3-dimensional graphs. We were also able to characterize the impact of radiation damage on the linearity and position error of the detectors.
© EDP Sciences, 2014
