https://doi.org/10.1051/epjap/2022220256
Microstructure and electrical transport properties of nanoscale [(CO40Fe40B20)34(SiO2)66/(In2O3)/C]46 multilayers
1
Voronezh State University,
394018
Voronezh, Russia
2
Voronezh State University of Engineering Technologies,
394036
Voronezh, Russia
3
Voronezh State Technical University,
394026
Voronezh, Russia
* e-mail: tangar77@mail.ru
Received:
10
October
2022
Revised:
30
November
2022
Accepted:
5
December
2022
Published online: 18 January 2023
We investigated the role of microstructure and In2O3/C interlayer thickness on the electrical transport properties of [(Co40Fe40B20)34(SiO2)66/(In2O3)/C]46 multilayers prepared using ion-beam sputtering. These multilayers were characterized using an X-ray diffraction, X-ray reflectivity, impedance spectroscopy, and magnetoresistive measurements. The X-ray diffraction data showed that regardless of the layer thickness, all components of the multilayers are X-ray amorphous. Fitting X-ray reflectivity data, multilayer periodicities are extracted and layers thicknesses, densities and roughnesses are determined. Impedance spectroscopy has shown a resistive-capacitive coupling between electrically conductive ferromagnetic CoFeB clusters which corresponds to the model of a prepercolation composite. For the thinnest multilayer with nonmagnetic In2O3/C interlayer thickness of about 1.6 nm, we managed to achieve a magnetoresistance of about 0.8% at room temperature and 3.2% at cryogenic temperature.
© EDP Sciences, 2023