Eur. Phys. J. Appl. Phys. 99, 30 (2024)
https://doi.org/10.1051/epjap/2024230185

Original Article

Synthesis and assessment of the Mo/MoO₃/CZTS/Ag diode fabricated by one-pot hydrothermal route: impact of temperature

¹ Applied physics department, School of Applied Sciences, University of Technology, Baghdad, Iraq
² Center of Solar Energy Research, Ministry of Science and Technology, Baghdad, Iraq

^* e-mails: Salma_aljawad@yahoo.com; Selma.M.AlJawad@uotechnology.edu.iq

Received: 23 September 2023
Accepted: 16 October 2024
Published online: 19 November 2024

Abstract

A facile one-step hydrothermal method was utilized to prepare Cu₂ZnSnS₄ (CZTS) film employing ethylenediaminetetraacetic acid (EDTA) as a complexing agent. An effective molybdenum oxide layer was also formed using the same approach for forming the Cu₂ZnSnS₄ film. The influence of preparation temperature on structural, morphology, and optical characteristics was studied. The formation of crystalline kesterite phase Cu₂ZnSnS₄ films with preferred orientation along the (112) plane was confirmed by X-ray diffraction and Raman spectroscopy, and it was also demonstrated that structure property changes with preparation temperatures: kesterite phase Cu₂ZnSnS₄ is formed at lower preparation temperatures and kesterite phase Cu₂ZnSnS₄ and Cu₂S are formed with increasing preparation temperature. Also, Raman's analysis confirmed the formation of a molybdenum oxide layer on the Mo substrate. Field emission scanning electron microscopy revealed that surface morphology changes from leaves of trees to flake-flowers. According to UV-visible analysis, Cu₂ZnSnS₄ films exhibited high and wide absorbance spectra in the visible and infrared regions and a band gap between (1.67–1.9) eV. Photoluminescence analysis revealed emission peaks at (1.569, 1.55, and 1.56) eV for samples prepared at (160, 200, and 230) °C, respectively, which is very close to the band's gap of Cu₂ZnSnS₄. Finally, the electrical study of Mo/MoO₃/CZTS/Ag junctions was performed using current-voltage (I–V) measurement.