2016 Impact factor 0.684
Applied Physics
Export the citation of the selected articles Export
Select all

The European Physical Journal Applied Physics

Volume 20 / No 1 (October 2002)


Semiconductors and Devices

Organic Materials and Devices

Surfaces, Interfaces and Films

Imaging, Microscopy and Spectroscopy

Instrumentation and Metrology

Editors-in-Chief
V. Serin and L. Vina
ISSN (Print Edition): 1286-0042
ISSN (Electronic Edition): 1286-0050

© EDP Sciences

Conference announcements