Eur. Phys. J. Appl. Phys. 27, 399-401 (2004)
https://doi.org/10.1051/epjap:2004070

Evaluation of small scattering defects densities by laser scattering tomography: application to levitated glasses

¹ Centre d'Électronique et de Micro-optoelectronique de Montpellier, Université Montpellier II, Place E. Bataillon, 34095 Montpellier Cedex 5, France
² Commissariat à l'Énergie Atomique, Centre de Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France

Corresponding author: gall@cem2.univ-montp2.fr

Received: 10 July 2003
Accepted: 18 December 2003
Published online: 15 July 2004

Abstract

A specific experimental Laser Scattering Tomography (LST) acquisition procedure is presented. It is adapted to the characterization of materials containing scattering defects ranging from 1 to 10²/mm³. The technique makes it possible to obtain good resolution within a volume chosen to contain a statistically significant defect density. This method is used to show that the gas levitation technique makes it possible to significantly decrease scattering defects in glasses. In parallel, individual study of defects in such glasses is also presented.