The European Physical Journal Applied Physics

Polarimetric scattering from a layer of spatially oriented metamaterial small spheroids p. 3

Photocurrent simulation in an n-p-n-p silicon multilayer solar cell p. 11

Density measurement of W thin films coating by combination of ion beam analysis and scanning electron microscopy p. 17

Electronic conduction in 40 MeV²⁸Si⁵⁺ ion irradiated Se-Te-Pb thin films p. 23

Microstructure and morphology evolution in chemical solution deposited semiconductor films: 3. PbSe on GaAs vs. Si substrate p. 27

Diode-pumped passively Q-switched intracavity-frequency-doubling Nd:GdVO₄/KTP green laser with Cr₄₊:YAG saturable absorber p. 31

Imaging atomically sharp crack tips in mica by contact mode AFM under ambient conditions p. 37

A comparative study of the behaviour of silver, copper and nickel submitted to a constant high power flux density p. 45

A general modelling and control algorithm of a three-phase multilevel diode clamped inverter by means of a direct space vector control p. 53

Metrological applications of Mueller polarimetry in conical diffraction for overlay characterization in microelectronics p. 63

Estimation of local error by a neural model in an inverse scattering problem p. 71