Eur. Phys. J. Appl. Phys. 31, 179-183 (2005)
https://doi.org/10.1051/epjap:2005063

Optical constants of 2,3-bis-(N,N-1-naphthylphenylamino) -N-methylmaleimide thin film by spectroscopic ellipsometry

National Laboratory of Integrated Optoelectronics, Jilin University, Changchun, 130012, China

Corresponding author: xiewenfa@mail.edu.cn

Received: 4 February 2005
Revised: 18 May 2005
Accepted: 8 June 2005
Published online: 14 September 2005

Abstract

Optical constants of 2,3-bis-(N,N-1-naphthylphenylamino)-N-methylmaleimide (NPAMLI) thin film grown on silicon substrate by thermal evaporation were investigated using variable angle spectroscopic ellipsometry (VASE). Accurate refractive index n and extinction coefficient k are reported in the energy range of 1.0 to 5.0 eV. Cauchy model, one-oscillator Lorentz model, and six-oscillator Lorentz model were used to fit the experiment data. The optical gap of NPAMLI and the visible absorption peaks at 2.35 and 2.87 eV were also derived from the VASE spectrum.