2024 Impact factor 0.9
Applied Physics

The European Physical Journal Applied Physics

Volume 41 / No 1 (January 2008)


Export the citation of the selected articles Export
Select all

Semiconductors and Related Materials

Microelectronics and Optoelectronics

Laser and Optics

Magnetism and Superconductivity

Characterization of Materials: Imaging, Microscopy and Spectroscopy

Plasma, Discharge and Processes

Instrumentation and Metrology

Editors-in-Chief
V. Mauchamp et P. Moreau
ISSN (Print Edition): 1286-0042
ISSN (Electronic Edition): 1286-0050

© EDP Sciences