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Applied Physics

The European Physical Journal Applied Physics

Volume 41 / No 3 (March 2008)

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Review Article

Semiconductors and Related Materials

Microelectronics and Optoelectronics

Nanomaterials and Nanotechnologies

Characterization of Materials: Imaging, Microscopy and Spectroscopy

Plasma, Discharge and Processes

V. Mauchamp et P. Moreau
ISSN (Print Edition): 1286-0042
ISSN (Electronic Edition): 1286-0050

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