Arc behavior in low-voltage arc chambers 22910
Published online: 26 January 2010
DOI: 10.1051/epjap/2010001
The European Physical Journal Applied Physics
Volume 49 / No 2 (February 2010)
Focus on Electrical Contacts
A new simulation approach to characterizing the mechanical and electrical qualities of a connector contact 22909
Published online: 26 January 2010
DOI: 10.1051/epjap/2010002
Open Access
Current noise up to GHz band generated by slowly breaking silver-compound contacts with external dc magnetic field 22908
Published online: 26 January 2010
DOI: 10.1051/epjap/2009209
Nanotomography of electrical contacts – new insights by high resolution 3D analysis of local material degradation 22907
Published online: 22 December 2009
DOI: 10.1051/epjap/2009210
Numerical and experimental study of the contact resistance for high copper alloys in force domain 1–100 N 22906
Published online: 22 December 2009
DOI: 10.1051/epjap/2009208
Microscopic study of intermetallic compound formation by in situ method 22905
Published online: 22 December 2009
DOI: 10.1051/epjap/2009207
Study of the arc behavior in low-voltage circuit breaker by means of optical and magnetic measurements 22904
Published online: 22 December 2009
DOI: 10.1051/epjap/2009150
Effect of fluorinated lubricants on the friction modes of tin electrical contacts submitted to fretting 22903
Published online: 22 December 2009
DOI: 10.1051/epjap/2009143
Conductive nanocomposite ceramics as tribological and electrical contact materials 22902
Published online: 22 December 2009
DOI: 10.1051/epjap/2009122
Conductive polymer switching mechanism for high power current-limiting applications 22901
Published online: 22 December 2009
DOI: 10.1051/epjap/2009097
Plasma, Discharges and Processes
Plasma nitriding of aluminium in a pulsed dc glow discharge of nitrogen 21001
Published online: 26 January 2010
DOI: 10.1051/epjap/2009203
Thin Films
Complex optical filter prepared by sputter deposition 20501
Published online: 26 January 2010
DOI: 10.1051/epjap/2009205
Review Article
Free Access
X-ray metrology for advanced microelectronics 20101
Published online: 26 January 2010
DOI: 10.1051/epjap/2009211
