Eur. Phys. J. Appl. Phys. 51, 10501 (2010)
https://doi.org/10.1051/epjap/2010063

Novel MgO/SiO₂ double protective layers to prevent Ag mirror degradation

¹ Image Architecture Lab, Semiconductor R&D center, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea
² AE group, Corporate Technology Operations SAIT, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea
³ Advanced R&D group 3, Digital Printing Division, Samsung Electronics Co. Ltd., Suwon, 443-370, Republic of Korea
⁴ Department of Material Science & Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Republic of Korea
⁵ Department of Physics, College of Science and Technology, Yonsei University, Wonju, 220-710, Republic of Korea

Corresponding author: kihong21.kim@samsung.com

Received: 14 January 2010
Accepted: 31 March 2010
Published online: 17 June 2010

Abstract

We demonstrate a very stable silver-coated mirror exploiting novel MgO/SiO₂ double layers. It was found that the MgO/SiO₂ protective layer provides a good adhesion and protection to the silver surface. Using epoxy-Ti(40 nm)-Ag(60 nm)-MgO(5~10 nm)-SiO₂(25 nm) mirror structures, we achieved over 95% reflectivity and observed a minimal degradation in reflectance even after severe environmental tests.