Eur. Phys. J. Appl. Phys. (2013) 63: 14406
https://doi.org/10.1051/epjap/2013120479

High-frequency characterization and modeling of single metallic nanowires^*

IMEP-LAHC, Grenoble-INP, UJF, CNRS, US, 3 Parvis Louis Néel, BP 257, 38016 Grenoble Cedex 1, France

^a e-mail: philippe.benech@leg.ensieg.inpg.fr

Received: 22 October 2012
Accepted: 9 April 2013
Published online: 5 July 2013

Abstract

The transmission line characteristics of an individual aluminum metallic nanowire up to 100 GHz are presented in this paper. We have built a reliable framework for characterizing such nanowires using a specially designed coplanar waveguide platform. We systematically estimate the pad parasitics, contact impedance and transmission line parameters based on an equivalent circuit model and cascade-based de-embedding theory. This is the first time that such external parasitic elements have been successfully removed from a nanoscale transmission line. The extracted frequency-dependent electrical responses show good signal levels and a high degree of reproducibility.