https://doi.org/10.1051/epjap/2013130365
In situ break-junction sample holder for transmission electron microscopy
1
Laboratoire de Physique des Solides, CNRS, UMR 8502 Université Paris Sud, 91405 Orsay, France
2
Service de Physique de l’Etat Condensé, URA CNRS 2464 CEA/DSM/IRAMIS/SPEC Orme des Merisiers, 91191 Gif-sur-Yvette, France
a e-mail: eswara@lippmann.lu
Received:
2
August
2013
Revised:
2
October
2013
Accepted:
18
October
2013
Published online:
9
December
2013
In this article, we report on the design and construction of an in situ break-junction sample holder for transmission electron microscopy. The holder is based on the differential-screw mechanism. The technical details and a comprehensive consideration to all relevant critical issues surrounding the instrumentation procedure are presented. An application of the newly developed instrument is demonstrated using the example of a micro-scale gold wire. We also provide a detailed discussion on the challenges involved and the pitfalls to avoid in developing similar in situ holders.
© EDP Sciences, 2013
