2024 Impact factor 0.9
Applied Physics

The European Physical Journal Applied Physics

Volume 82 / No 2 (May 2018)


Export the citation of the selected articles Export
Select all

Surfaces and Interfaces

Instrumentation and Metrology

Plasma, Discharges and Processes

Nanomaterials and Nanotechnologies

Thin Films

Semiconductors and Devices

Editors-in-Chief
V. Mauchamp et P. Moreau
ISSN (Print Edition): 1286-0042
ISSN (Electronic Edition): 1286-0050

© EDP Sciences