2022 Impact factor 1.0
Applied Physics

The European Physical Journal Applied Physics

Volume 26 / No 3 (June 2004)

Export the citation of the selected articles Export
Select all

14th International Colloquium on Plasma Processes (CIP 2003)

Semiconductors and Devices

Surfaces, Interfaces and Films

Imaging, Microscopy and Spectroscopy

S. Giorgio and D. Jacob
ISSN (Print Edition): 1286-0042
ISSN (Electronic Edition): 1286-0050

© EDP Sciences