2016 Impact factor 0.684
Applied Physics
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The European Physical Journal Applied Physics

Volume 34 / No 1 (April 2006)


Semiconductors and Related Materials

Surfaces, Interfaces and Films

Laser and Optics

Characterization of Materials: Imaging, Microscopy and Spectroscopy

Plasma, Discharge and Processes

Physics of Energy Conversion and Coupled Phenomena

Instrumentation and Metrology

Erratum

Editors-in-Chief
V. Serin and L. Vina
ISSN (Print Edition): 1286-0042
ISSN (Electronic Edition): 1286-0050

© EDP Sciences

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