2017 Impact factor 0.802
Applied Physics

The European Physical Journal - Applied Physics: Special issues

34801-34815
Materials for Energy harvesting, conversion and storage II (ICOME 2016)
24701-24718
6th Central European Symposium on Plasma Chemistry (CESPC-6)
24601-24616
Materials for Energy Harvesting, Conversion and Storage (ICOME 2015)
20801-20812
The 14th International Symposium on High Pressure Low Temperature Plasma Chemistry (HAKONE XIV)
10001-14408
International Semiconductor Conference Dresden-Grenoble – ISCDG 2012
24301-24326
Topical issue: 13th International Symposium on High Pressure Low Temperature Plasma Chemistry (Hakone XIII). Edited by Nicolas Gherardi, Henryca Danuta Stryczewska and Yvan Ségui
20301-24206
Topical issue: New trends in porous media. Edited by D. Salin
30201-34108
Focus on organic electronic devices
24001-24027
Topical Issue: 18th International Colloquium on Plasma Processes (CIP 2011)
10101-13705
Topical Issue: 5th Colloquium Interdisciplinary in Instrumentation (C2I) 2010
20101-23907
International Symposium on Flexible Organic Electronics 2010 (ISFOE)
10101-13813
Focus on Hakone XII
30001-33512
Focus on Recent advances in (S)TEM and related spectroscopies: a tribute to C. Colliex
20701-23412
Focus on Fuel Cells 2009
30101-33609
Focus on Telecom 2009 & JFMMA
20301-23311
Focus on Numelec
30301-33212
Focus on Flexible Organic Electronics
10301-12904
Focus on Electrical Contacts
30301-33007
Focus on Metamaterials
20101-22910
International Conference on Electrical Contacts (ICEC 2008)
10301-13112
17th International Colloquium on Plasma Processes (CIP 2009)
22801-22821
11th International Symposium on High Pressure, Low Temperature Plasma Chemistry (HAKONE XI)
10301-12707
4th Colloquium Interdisciplinary in Instrumentation (C2I 2007)
30701-32611
Metamaterials
12501-12513
International Symposium on Flexible Organic Electronics (IS-FOE)
pp. 1-107
10th Meeting of the French Microscopy Society (SFMU)
pp. 269-368
Topical Issue ITFPC (Innovations on Thin Films Processing and Characterisation)
pp. 145-268
Reliability in Electromagnetic Systems (IET)
pp. 1-66
16th International Colloquium on Plasma Processes (CIP 2007)
pp. 77-201
NUMELEC 2006
pp. 73-163
15th International Colloquium on Plasma processes (CIP 2005)
pp. 7-506
Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
pp. 151-234
14th International Colloquium on Plasma Processes (CIP 2003)
pp. 166-231
ACO: Action Coordonnée Optique
pp. 77-163
Instrumentation Interdisciplinary Colloque (C2I 2001)
Editors-in-Chief
V. Serin and L. Vina
ISSN (Print Edition): 1286-0042
ISSN (Electronic Edition): 1286-0050

© EDP Sciences